Packed event lineup for HESIC this fall; WAMIC hosts metrology demo day

The Horticultural & Environmental Sciences Innovation Centre (HESIC) has a full list of exciting industry events on their calendars this fall.

On Oct. 4 and 5, HESIC will be exhibiting at the Canadian Greenhouse Conference (CGC) in Niagara Falls, along with the Business & Commercialization Innovation Centre, as part of the larger Greenhouse Technology Network booth. CGC is Canada’s foremost event and connection point for commercial growers of crops produced in a controlled environment. The conference attracts growers from across North America, gathers experts from around the world and showcases innovative production techniques, research, products, and technology.

Next, from Nov. 4-8, the HESIC team will be at the Agri-Food Innovation Council (AIC) National Meeting in Canada’s Capital Region. This is an occasion for leaders in research and innovation in the agri-food sectors and related stakeholders to gather and share information on the latest programs and innovation. This year, the theme is: Agri-Food: Bringing research and innovation to reality – knowledge dissemination and adoption.

Following that, from Nov. 19-21, women from the HESIC team will represent Niagara College at the Advancing Women in Agriculture Conference East, also in Niagara Falls.

Finally, team members will be attending the Canadian Fruit & Veg Summit on Nov. 29 in St. Catharines.

If you’re at any of these events, keep an eye out for HESIC team members who are happy to chat with you about how they can help solve your horticultural & environmental sciences innovation challenge.


WAMIC hosts Metrology Demo Day Oct. 24

On a different note, the Walker Advanced Manufacturing Innovation Centre (WAMIC) invites industry to come to the Welland campus for a Demo Day event focusing on Dimensional Metrology; registration is required.

The event will take place on Oct. 24 from 11 a.m. to 1 p.m. at the Welland campus.

The agenda will include a mini trade-show display, lunch, and a presentation from the Director of Metrology for CAD Micro Solutions, with a Q&A session to follow.

We hope to see you there!